Capacitance measurements on silicon microstrip detectors

Summary form only. Load capacitance is the most significant parameter determining the noise level of readout electronics. In the case of silicon microstrip detectors, it is represented by the capacitance of one strip to all the adjacent strips. Measurements of this capacitance on the p- and n-side of detectors with various geometries have been performed. Double-sided detectors with a second metal layer and different readout patterns were also studied.<
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