Extracting double layer charge density distributions using the method of moments

Using the method of moments, it is shown that the charge distribution can be directly extracted from a measured potential profile. The technique is described and placed on a theoretical foundation. The predicted charge distribution for a potential profile V=V/sub 0/ tanh (x/L) using this technique is compared with a direct solution of Poisson's equation. It is shown that similar results are obtained even if random noise is present in the system.<
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