Effect of RuO/sub 2/ on the behavior of silver at thick-film terminations

In an attempt to understand the silver-glass interactions at the electrode/resistor terminations in hybrid integrated circuits, the behavior of silver in binary 75PbO-25SiO/sub 2/ glass containing up to 20 wt.% RuO/sub 2/ particles was studied between 650 and 850 degrees . It is shown that the dissolution of silver into glass increases with increasing amount of RuO/sub 2/ particles. A different temperature dependence of dissolution was observed for RuO/sub 2/-free and RuO/sub 2/-doped glasses. Silver-ion-RuO/sub 2/ interactions have been proposed as a possible mechanism responsible for the increased dissolution of silver in the glass.<
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