APRIS: Automatic Pattern Recognition and Inspection System

A fast visual automatic pattern recognition and inspection system is described. The major aim of the system is the recognition and inspection of 2D patterns and images in the printing industries. The strategy behind the system uses a hybrid structure combining the conventional n-tuple method and the pixel-by-pixel comparison method. Both of these methods lend themselves to a massively parallel hardware implementation using application specific integrated circuits (ASICs). High-density field programmable gate arrays (FPGAs) were chosen for the implementation of the system, providing the high speeds required by the automatic recognition and inspection of modern automated assembly lines.<
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