Noise in self-electrooptic effect device logic gates

We study the fundamental noise processes of SEED-based logic gates. The noise is calculated for symmetric SEEDs (S-SEEDs), asymmetric Fabry-Perot S-SEEDs (ASFP S-SEEDs), and SEEDs combined with transistor driving circuits (FET-SEEDs). The source of noise which determines the minimum power required to switch the SEEDs in a given time increment is quantum noise associated with photon absorption and subsequent carrier or exciton recombination. The results show that FET-SEED logic gates have the lowest noise power as compared with S-SEEDs and ASFP S-SEEDs.<
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