A summary of recent VLSI SEU and latch-up testing (for space application)

As the complexity of satellite systems increases, interest in using highly integrated microelectronic devices also increases. The SEU and latch-up characteristics of these devices are usually not known. Therefore, thorough testing should be performed on an VLSI device that is considered for use in space systems. The authors detail the results of a series of SEU and latch-up tests on VLSI devices of interest for use in future satellite systems and describe their test system designed to efficiently perform these tests.<
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