Total ionizing dose radiation characterization of the Natel HSRD1056RH resolver-to-digital converter hybrid

The total ionizing dose (TID) test of the Natel HSRD1056RH synchro/resolver-to-digital converter for the space environment has been completed using the /sup 60/Co source at JPL. A classical 'rebound' effect was observed during time dependent effects (TDE) test due to slight parametric drifts of the internal CMOS circuitry. Circuit analysis suggested a 'quick fix' to this sensitivity which was verified by testing of modified devices. The large conversion error was found due to the high frequency, rather than the ionizing dose radiation.<
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