Influence of interfacial phenomena on conduction and breakdown in a thin dielectric liquid layer

Experimental data relating to the influence of interfaces on the conduction and breakdown mechanisms of a thin dielectric liquid layer was obtained. The measurements were carried out to check the liquid conduction mechanisms at high electric fields. It was found that an injection phenomenon at the interface plays the dominant role. The data suggest that the physics of the electrical breakdown of a thin dielectric liquid layer is correlated with the high-field conduction mechanism.<
>