The structure of complete test sets for programmable logic arrays

A new approach to complete testing of a PLA without any auxiliary facilities is presented. PLA testability is provided by the exact minimization of the PLA in the number of product lines. A theorem about the structure of a complete test set detecting all testable single and multiple crosspoint faults in such a minimal PLA is presented. It formulates the three conditions to which the complete test set satisfies. A technique for constructing complete test sets is discussed.<
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