Towards a mixed-signal testability bus standard P1149.4

A Working Group of the IEEE has been working towards the development of a standard testability structure to be built into mixed-signal chips. The structure is intended to be used to facilitate the testing of mixed-signal circuits at all levels from chip to system, and will form part of the IEEE 1149 set of Standards. This paper reviews the progress that has been made by 1993, and indicates the kind of structure that the Working Group is considering.<
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