Photoluminescence probing of InGaAs-InAl(Ga)As multiquantum well structures: a correlation to laser diode thresholds

Summary form only given. The photoluminescence (PL) properties of molecular-beam-epitaxy-grown InGaAs-InAl(Ga)As quantum well structures have been investigated. The ultimate aim of this work is to establish a workable relationship between PL efficiency and the MQW (multiquantum well) laser diode thresholds. To this end three types of samples have been analyzed: SQWs (single quantum wells) of nominal thickness approximately 30, approximately 60, and approximately 90 AA and located at different depths with varied buffer layer (InAlAs or InAlGaAs) thicknesses; MQWs identical to laser structures but without the top p-confinement layer; and complete MQW laser structures with grown-in p-n junction. The benefits of some specified heat treatments to improve the PL quality of the laser structures are presented and discussed.<
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