A new de-embedding technique for on-board structures applied to the bandwidth measurement of packages

A de-embedding technique for on board structures or devices under tests (DUTs) is presented. The key feature of the method is the comparison between the S-parameter data for the embedded DUT and the data for a judiciously chosen reference situation. The technique also uses the time-domain option of modern network analyzers. The approach is illustrated by detailed bandwidth measurements for a high pin count package.<
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