An open characterization component tool

With the growth of new technologies, new architectures that often needs custom cells development with the maturity of ASIC synthesis tools as well as silicon and data path compilers, it is critical to provide CAE tools with very accurate information. This includes timing information, power information, capacitance information as well as physical information. This article presents a tool that automates all processes involved in standard cell or gate-array characterization and briefly shows how the extracted information will be used in an integrated CAE framework.<
>