Accurate and efficient computation of dielectric losses in multi-level, multi-conductor microstrip for CAD applications

An approach to accurate and efficient computation of dielectric losses in complex microstrip structures is proposed. It can be used in lieu of lossy, full-wave solutions to provide accurate and efficient data for the CAD of multilevel, multiconductor MIC and MMIC structures. Results that are as accurate as lossy full-wave techniques over a wide range of frequencies, including the dispersive region, are obtained. In addition to providing accurate results, the method is up to three times faster, depending on the number and type of substrates or superstrates. Results for various multiconductor, multilevel structures that compare well with the lossy, full-wave approach and require significantly less computer time to compute are shown.<
>