A new 3-D surface measurement system using a structured light

The authors present a 3-D measurement method using a projected grid that permits an optimal geometrical exploitation of the calculated 3-D data. They propose a reliable method for solving the correspondence that establishes the link between the imaged grid and the original grid curve per curve without any ambiguity. The imaged grid is extracted by an efficient method that describes the distorted grid as a network of curves rather than a graph, and hence provides regular and precise 2-D information. The 3-D projected grid is calculated per curve by using the triangulation principle. Thus, two independent families of 3-D curves that parameterize the object surfaces can be used for a surface geometrical study.<
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