Self-testing checkers for arithmetic codes with any check base A

The design of self-testing checkers (STCs) for all arithmetic codes (AN codes, residue codes, and inverse residue codes) with any odd check base A is presented. The design of these checkers is based on the use of recently proposed highly-parallel schemes of the generators modulo A using carry-save adders and/or ROM. The new STCs cover a significantly larger spectrum of check bases A than the designs proposed to date, since only the STCs for so called low-cost arithmetic codes with A of the form A=2/sup a/-1 have been known to date. Also, the new STCs for codes with A=2/sup a/-1 are faster than conventional designs at no extra hardware cost.<
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