The non-linear feedback shift-register as a built-in self-test (BIST) resource

Properties of nonlinear-feedback shift registers (NLFSRs), are studied and their suitability as built-in self-test (BIST) components in VLSI circuits is investigated. The feasibility is discussed of mapping fault-free circuit-under-test response to one of the least frequently occurring signatures within the signature space of the n-stage NLFSR. A number of illustrations are offered that justify the serious consideration of NLFSRs as components for use in BIST applications.<
>