On benchmarking digital testing systems

An approach to quantify the digital testing system (DTS) attributes is presented. The quantification will help in determining criteria according to which benchmark circuits are selected. Two main parameters that can be used in the comparison are the speed of operation and memory requirements. Attempts are made to relate each of these two parameters to different attributes of the DTS. Experiments were carried out using a commercial automatic test-pattern generator to generate test sets for some ISCAS circuits. The results of the experiments are presented.<
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