A model for surface recombination velocity and lifetime of semiconductor lasers

A simple and powerful relationship is presented for estimating the lifetime of continuous-wave (CW) diode lasers. Accelerated aging tests can directly be translated into the relationship. A model for the surface recombination velocity is developed based on the physical and chemical phenomenon governing the change of the surface recombination velocity. This model, together with a criterion for no thermal runaway developed earlier, is used to arrive at the simple relationship. The relationship provides a physical basis for estimating the lifetime.<
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