Algebraic/topological combined strategies for sequential ATPG

The authors describe an algorithm for automatic test pattern generation for sequential integrated circuits that is based on a combination of algebraic and topological techniques. The algebraic concepts of observability and controllability functions have been applied to an innovative version of the sequential D-algorithm working on the combinational part of the network that has been partitioned into several fanout-free regions. The ideas of observability order, controllability order, and incompatibility function have been introduced in order to improve the ATPG performance. An application example of the proposed algorithm is discussed, and experimental results are presented.<
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