Thickness dependent coercivity in sputtered Co/Pt multilayers

Sputtered Co/Pt multilayers grown on etched SiN/sub x/ buffers exhibit large perpendicular magnetic anisotropy and show a striking thickness dependence of the perpendicular coercivity. H/sub C//sup perpendicular to / of a series of N/sub x/(0.3 nm Co/1.1 nm Pt) multilayers varies from 0 to 3.3 kOe, with a linear rise in the range 2>