Effect of random errors in cylindrical near field measurements

Expressions have been derived previously to predict the effect of random errors in planar near-field measurements. Similar equations for cylindrical near-field measurements are not available. Random errors are due to A/D (analog-to-digital) quantization, receiver noise or random room scattering; their nature is additive and will limit the accuracy of the far-field pattern. Since the near-to-far-field transformation is a linear operator the effect of additive noise can be analyzed by superposition. The near-field noise is assumed to be complex Gaussian noise, space stationary, with zero mean, and variance sigma /sup 2/. In the present analysis, the statistical characteristics of the far-field noise are found. Numerical simulations have been carried out to validate the expressions obtained.<
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