Dielectric life test with cut-tail sample in groups and estimation of distribution parameters

In many cases, the lifetimes of solid dielectrics are distributed as the exponential distribution, and the lifetime characteristics of different materials could be statistically evaluated by distribution parameters. The cut-tail sample is used to reduce the test time and specimens are divided into groups to make the experiments available. A method of estimation of the exponential distribution parameters is developed for the cut-tail sample and specimens in groups. Simulation experiments are completed with the aid of the Monte Carlo method to investigate some important aspects such as the necessary number of specimens, errors of obtained statistical characteristic values, test times, and expense for specimens. Practical experiments have supported the results obtained from simulation experiments.<
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