Current measurement dedicated mixed system-on-chip for highly integrated power control

This paper focused on the design and prototyping of a contactless current measurement system-on-chip (SoC) in standard CMOS technology. Thus, without additional post-processing cost, a differential architecture, including two improved Hall plates, embedded electronics and auto-balancing is described. Experimental results measured on a 0.6 mum CMOS technology prototype demonstrate the functionality of the SoC. This one is integrated in further highly integrated power control