RF Conducted noise measurements of automotive electrical and electronic devices using artificial network

Two RF conducted noise measurement systems have been developed for laboratory measurements of automotive electrical and electronic devices. One is a noise emission measurement system for measuring noise level from the electrical devices while the other is a susceptibility measurement system for measuring the susceptibility level of the electronic devices to the noise. The former's function is to measure a histogram of noise level, and the latter functions both to measure the malfunction level and to judge a malfunction mode of the electronic devices. These measurement systems are applicable to the frequency of 150 kHz-60 MHz. These are for laboratory measurements performed with the measurement systems connected to an artificial network of the automotive electrical network. This artificial network represents electrical networks used on Japanese compact passenger vehicles.