Covariance-based uncertainty analysis of the NIST electrooptic sampling system

We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electrooptic sampling system. This formulation offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode