Diagnostics of dielectric parameters of two-layer structures by means of open resonators in the millimeter wave-band

The principles of measurement of UHF parameters of two-layer structures: the dielectric permittivity (epsiv) and the loss tangent (tgdelta) using open resonators are presented. These principles are based on the measurement of open resonator characteristics-the Q-factor and the resonance frequency-when putting the sample under investigation into the resonance volume