Investigation of technology scaling effect on SiGe HBT oscillator phase noise using impulse sensitivity function

Using impulse sensitivity function (ISF), the upconversion of low-frequency noise to phase noise in SiGe HBTs is investigated as a function of technology scaling. The 1/f noise upconversion under periodic large signal condition is simulated using a cyclostationary model, which is supported by recent SiGe HBT 1/f noise data, and compared with traditional dc current based model. The impact of technology scaling on various ISF is examined, and implications to technology scaling are discussed.