A 19.5b dynamic range CMOS image sensor with 12b column-parallel cyclic A/D converters

A CMOS image sensor with 117 dB DR is demonstrated in a 0.25 /spl mu/m CMOS technology through merging of multiple exposures. A 12b cyclic ADC with integrated noise canceling is implemented in the column of the image sensor and achieves a DNL of +0.4/-0.8 LSB.