Enhanced shot noise in p-n diodes due to thermal feedback

Mueller's mechanism for obtaining enhanced shot noise in p-n diodes due to thermal feedback is evaluated for a small diode represented by a lumped circuit thermal model. The excess noise is negligible at low-power dissipation but very significant if the device can operate near thermal instability. For devices represented by a distributed thermal circuit, the device can show excess noise with a spectrum 1/f
^α
where α is close to unity, over a limited frequency range.