Validity of using a fixed analog input for evaluating the SEU sensitivity of a flash analog-to-digital converter

The single-event upset (SEU) rate in a flash analog-to-digital converter (ADC) AD9058 on board a space experiment varied by more than an order of magnitude, depending on the input. A pulsed laser aided in elucidating the reasons, which were found to be the result of the unique design of the AD9058.