FTA technique addressing parametric failures of complex electronic and hybrid devices

Specifics of modern complex products and reliability assurance of their parametric performance are discussed. Differences between full binary and continuous parametric failures are explained. Characteristics of parametric failures, their classification, models, and a unified rank system are proposed. New application-specific gate structures are introduced, substantiated, and computed for main parametric failure models employing joint FTA and FMECA technique. Detailed practical analysis, formulas, typical examples and recommendations are presented. Broader application of the methodology is justified and exemplified.