Harmonical characterization of a microstrip bend via the finite difference time domain method

A 90 degrees microstrip bend is characterized using a time-frequency method based on the finite-difference-time-domain (FDTD) method. Time evolution of the currents generated by FDTD are Fourier transformed to lead to S-parameters and the radiated powers characteristic of the microstrip bend. The method for calculating both radiation and surface wave losses is developed for microstrip structures. The results of the 90 degrees microstrip bend are compared with the results of the mitered microstrip bend.<
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