Technology mapping using Boolean matching and don't care sets

The authors describe a new approach to technology mapping where matchings are recognized by means of Boolean operations. The matching algorithm uses tautology checking based on Shannon decompositions. They show how to use the symmetry and unateness properties to speed-up the Boolean matching algorithm. They examine how don't care information can be used during Boolean matching. The algorithms have been implemented in program Ceres and tested on the 1989 MCNC benchmark circuits.<>