Multiple-imaging in 2-D MMI silicon hollow waveguides

We investigate the multiple-imaging in two-dimensional (2-D) multimode silicon Hollow waveguides. Two waveguides with dimensions 40×80 μm
²
and 80×80 μm
²
are fabricated using microelectromechanical system compatible technology and measured at 675 nm. The multiple-imaging in the 2-D transverse plane is reported, and the measured imaging lengths agree with the theoretical predictions.