Hazard characterization of basic Boolean functions

The author presents a method to verify the dynamic behavior of Boolean functions and characterize hazards associated with them. This technique makes it possible to uniformly detect hazards associated with two-level combinational circuits. Specifically, the dynamic behavior of the basic Boolean functions AND, OR, and NOT is considered, and a theorem for the intrinsic AND-function (IAF) hazard is proved. Three corollaries for three different versions of the IAF hazard are given, and a theorem for the intrinsic OR-function (IOF) hazard is proved. Three corollaries for three different versions of the IOF hazard are also given, and the basic Boolean function NOT is shown to be hazard-free. This method lends itself to a rule-based characterization that can be easily automated.<
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