Multiple-input resonant-tunneling logic gates for flash A/D converter applications

Multiple-input resonant-tunneling (RT) logic gates have been proposed for flash analog-to-digital converter applications. An error-mode operation has been found in conventional RT gates called MOBILE, when the number of inputs increases. By introducing an RTD/HEMT series connection, to suppress the error operation, we can successfully design 4-, 8-, and 16-input RT gates, which are essential to obtain compact flash ADCs.