A scaling technique for partial element equivalent circuit analysis using SPICE

A scaling technique for partial element equivalent circuit (PEEC) analysis using SPICE is introduced in this letter. The perturbation series based scaling is applied to the component values extracted by the standard PEEC method to get up to an order of magnitude improvement in relative accuracy of scattering parameters with SPICE simulation. The effectiveness of the technique is verified by using the numerical example of a stripline structure and comparing the results with that of the method of moments (IE3D).