Numerical through-resistor (TR) calibration technique for modeling of microwave integrated circuits

A through-resistor (TR) calibration procedure is proposed for parameter extraction and accurate modeling of planar discontinuities and circuits by using a full-wave technique such as method of moments (MoM). This new scheme allows the effective use of a commercial electromagnetic field simulator in removing inherent numerical noises or errors in simulation, and making the parameter extraction for circuit models. A microstrip open-end and a microstrip gap are studied and effectiveness of this new scheme is verified.