A new semi-empirical model for funneling assisted drain currents due to single events

We present a new semi-empirical model for the funneling-assisted currents due to single events. It is then used to predict the collected charge due to the funneling process. Comparison with previously published simulated data using ISE CAD tools has shown that the relative error in the collected charge prediction is of about 0.8%. This model can be used for circuit simulations in space applications.