Stable extraction of linearity (V/sub IP3/) for nanoscale RF CMOS devices

We have proposed an improved and stable algorithm for linearity (V/sub IP3/) extraction by setting an optimized measurement node interval. This algorithm, considering the accuracy of measurement appliances, provides less noisy V/sub IP3/ without loss of details. Adopting it, V/sub IP3/ can be derived satisfying 1% error criterion. Accurate V/sub IP3/ extraction can be a strong help in CMOS performance analysis for the RF applications. Measurements were carried out on a nMOSFET.