1/f noise versus magnetic field in RuO/sub 2/ based thick film resistors

Low frequency noise has been measured in RuO/sub 2/+ glass thick film resistors in subkelvin temperatures and in magnetic fields. Samples were fabricated from laboratory-made pastes, which did not contain any modifiers (only RuO/sub 2/ and glass of known volume fractions). Measurements performed with ac technique show that below 4 K relative noise intensity increases significantly and becomes a factor limiting the resolution of RuO/sub 2/ temperature sensors. Magnetic field does not influence this resolution.