High energy proton SEU test results for the commercially available MIPS R3000 microprocessor and R3010 floating point unit

Proton single event upset (SEU) cross sections and proton total dose hardness of commercially available MIPS R3000 microprocessors (CPU) and R3010 floating point units (FPU) were obtained by exposing these parts to 256 MeV protons from the linear accelerator (LINAC) at the Los Alamos Meson Physics Facility (LAMPF). Parts from several manufacturers were tested. The CPUs and FPUs were tested dynamically during radiation exposure with specially designed assembly language codes which exercised a subset of the available instructions. Cross sections derived from the SEU data were used to calculate expected upset rates for a 500-km, 60-degree inclination orbit during quiet solar conditions and during the August 4. 1972, King solar fire event modeled by J.H. Adams et al. (1981).<
>