Fault grading operational self-test

A study is presented on fault grading of the OST (operation self-test) for a Delco VHSIC 1750A computer in its early design phases, using a commercially available hardware accelerator. The OST fault-grading effort illustrated the need for design methodologies that take into consideration the capabilities of today's CAE tools. A fault simulation methodology and design guidelines for optimizing the fault grading performance on these large systems are discussed.<
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