ASIC design for testability

Advanced testability techniques are described for ASIC (application-specific integrated circuit) design. BIST (built-in self-test), scan test, boundary scan, embedded cores, and mixed-signal circuitry are among the topics discussed. A CAE methodology and a specific case study are analyzed for each ASIC design choice. Emphasis is on modular design for test, automated testability analyses, and comprehensive pattern generation.<
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