Ferroelectric properties of PMNT thin films epitaxially grown on La-doped SrTiO/sub 3/

Thin films of single phase (PbMg/sub 1/3/Nb/sub 2/3/O/sub 3/)/sub 1-x/(PbTiO/sub 3/)/sub x/, x = 0.2, (0.8PMN 0.2PT), were epitaxially grown on La-doped (100)SrTiO/sub 3/ by a magnetron diode sputtering. Thickness of the sputtered thin films was ranged from 5nm to 1800nm. The PMNT thin films were grown through the Frank van der Merwe mode and showed single crystal-like uniform continuous structure. Their dielectric and/or ferroelectric properties were described.