An implementation of memory-based on-chip analogue test signal generation

This paper presents a memory-based on-chip analogue test signal generation approach that is suitable for the test of an analogue and mixed-signal (AMS) core. This core contains programmable electronic interfaces for acoustic and ultrasound transducers. The test signals that must be generated on-chip have only low or moderate frequencies (10 Hz-10 MHz). The test circuitry designed in a 0.18 /spl mu/m CMOS technology includes a programmable shift-register, a clock divider, and a programmable switched-capacitor filter bank. By controlling the shift-register length and the sampling frequency, the paper shows that high quality single tone signals can be generated on chip in the band of interest.