Characterization of the dynamics of semiconductor lasers using optical modulation

An optical modulation technique for measuring the intrinsic frequency response of semiconductor lasers is described. This technique, which uses an RF-modulated pump laser to create an optical modulation signal to inject into a DC-biased probed laser, offers significant advantages over previous methods such as being affected by electrical parasitics of either the laser to be characterized or the photodetector. The method allows extremely accurate measurements of many important dynamic parameters, including the nonlinear gain coefficients, the amount of spontaneous emission into the guided modes, and the differential carrier lifetime at lasing threshold.<
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