Reliability of the shuffle-exchange network and its variants

The reliability of the shuffle-exchange multistage interconnection network (SEN) and two variations of this network aimed at improving reliability through fault tolerance is considered. The two variations are the SEN with an extra stage and the redundant SEN. Exact closed-form expressions are derived for the time-dependent reliability of the 8*8 and 16*16 SEN and SEN with an extra stage (SEN+). A tight-reliability lower bound that is useful for the analysis of larger networks is derived. Numerical results are provided for networks as large as 1024*1024. A comparison of these networks shows that on the basis of reliability, the SEN+ is superior to the SEN and the redundant SEN.<
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