An automated deep sea simulation facility for testing electronic components

Can off-the-shelf electronic components be used in the deep ocean without protection from the very high hydrostatic pressure? This paper describes a test philosophy and a unique facility designed to answer this question and to determine the mechanisms of failure that are encountered under severe pressure. The facility consists of three pressure vessels, each having 150 electrical penetrators and a working pressure of 30,000 psi. Vessel temperature is controllable from
0\deg
C to
40\deg
C . The present semiautomatic pressure and temperature control is discussed along with a description of the designed-in capability for complete computer-controlled tests. The test philosophy includes the rationale for why the components are energized, what components are currently being tested, what components can be tested, and why failure analysis is performed. The data acquisition and reduction system is described as it currently exists and as it will exist when modified into a computer-controlled, real-time data system.